Semiconductor Inspection
Semiconductor manufacturers are rapidly transitioning from low-resolution analogue video systems to high-resolution digital imaging techniques in order to measure the quality of coated wafer materials. With our cameras manufacturers can easily take fewer images with far greater detail, saving valuable time and expenses. The advent of high-resolution digital imaging technologies such as the MEGAPLUS ES4020 camera are allowing manufacturers to inspect coated wafer materials faster and more efficiently than ever before.
Using the latest ultra-sensitive, high-speed charged-couple devices (CCDs), these cameras easily obtain steady-state and kinetic (time-resolved) data during inspections. As a result, manufacturers no longer have to deal with the high-noise produced by more traditional cameras, or take numerous images for capturing the finite details of their materials.
The MEGAPLUS ES4020 camera is ideal for demanding wafer and semiconductor applications, delivering up to 4MP of data at a sustained frame rate of 15 frames-per-second. Features include:
- Supports as many as four cameras on the MEGAPLUS central controller
- Low-noise and high-dynamic range
- Small camera heads fit in tight areas
- Interline CCD
- 2048 x 2048 pixels
- Color or monochrome
- 8, 10, 12, or bits
- CameraLink and FireWire interface
- Applications: medical imaging, flat panel inspection, wafer inspection
MegaPlus pioneered several state-of-the-art full-frame and interline sensor cameras specifically for the wafer inspections market. Whereas full-frame cameras permit extremely high-dynamic range, interline sensor cameras allow users to capture images at ultra-high frame rates. Princeton Instruments designs a range of cameras suited for imaging near-IR, visible, and UV imaging applications. Please contact us for more information concerning your cutting-edge application.
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MEGAPLUS ES4020
