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Princeton Instruments provides state-of-the-art CCD, ICCD, EMCCD and InGaAs cameras; spectrometers; spectrographs; imaging systems; optics and coatings that are key to the success of your application.

Imaging Group - Astronomy, BEC, Combustion, PIV, Single Molecule, Surface and Material Analysis, PSP, Nanotechnology

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Spectroscopy Group- Raman, LIBS, NIR, Absorption, Fluorescence, Luminescence

X-Ray Group - EUV, Lithography, XRS, Plasma, Diffraction, Microscopy, Tomography

Acton Optics & Coatings - Medical, Semiconductor, Material Processing, Analytical Instrumentation, Aerospace and Defense.


Introduction to scientific InGaAs FPA cameras

PI_tech_noteEven though light in the NIR and SWIR regions is invisible to the naked eye, its properties are quite similar to those of light in the visible (VIS) region of the spectrum. Like VIS light, NIR/SWIR light is reflective and can provide fine contrast and resolution in images acquired with an appropriately sensitive detector (e.g., an InGaAs FPA). This technical note offers an overview of InGaAs FPAs and discusses key performance features of InGaAs-based cameras for lowlight scientific imaging and spectroscopy applications in the NIR/SWIR regions of the spectrum.

Learn more from this PI Tech Note pdf >

What's New

Hot technology

Solar cell inspection via photoluminescence imaging in the NIR/SWIR
The use of photoluminescence (PL) imaging to inspect solar cells is a rapidly growing area of interest in the field of energy research. Recently, leading-edge groups have begun exploring the advantages of utilizing InGaAs focal plane arrays (FPAs) to characterize multicrystalline silicon (mc-Si) solar cells via PL imaging in the near infrared (NIR) and shortwave infrared (SWIR) spectral regions.

Learn more - Download the Application Note >>