X-ray spectroscopy is element-specific, used to directly examine a wide variety of solid and liquid samples non-destructively. The high-energy x-rays irradiate the sample and are absorbed by atoms within the sample. As absorption is discrete, the absorption energy required corresponds to the binding energy of the electron in the material. Once absorbed, the electron is ejected, allowing it to interact with the surrounding atoms to produce a spectrum.
X-ray absorption spectroscopy is commonly divided into two spectral regions:
- X-ray absorption near-edge structure (XANES) spectral region
- Extended x-ray absorption fine structure (EXAFS) region
X-Ray Photon Correlation Spectroscopy at a Third-Generation Synchrotron
The bright (high-flux) monochromatic and highly focused x-ray beams at third-generation
synchrotron sources around the world are advancing the field of x-ray photon correlation
spectroscopy (XPCS). In addition, newer CCD digital camera systems with high sensitivity and
resolution have extended the lower-intensity range of x-ray detection in XPCS applications.
This note describes several examples of XPCS in which high-performance CCD systems from
Princeton Instruments can be used to capture microscopic, low x-ray-flux images…Read Full Article
New QE Response Curves for Soft X-ray to VUV Energy Range
Since the invention of charge-coupled-device (CCD) technology in 1969, its extended sensitivity from the NIR to the x-ray region of the electromagnetic spectrum has been utilized to good effect in a wide variety of application areas.
Owing to the unique characteristics of their construction, CCDs are especially useful for imaging and spectroscopy performed in…Read Full Article