PI-MTEProduct Publications

Featured Publications

Nondestructive, high-resolution, chemically specific 3D nanostructure characterization using phase-sensitive EUV imaging reflectometry

Nano-Devices, Quantum-Devices, Phase-Sensitive Extreme Ultraviolet (EUV) Imaging Reflectometer, Coherent High-Harmonic Sources (HHG), Chemical Sensitivity, Ptychography Imaging Algorithms, Tabletop Microscope, Surface Topography, Layer Thickness, Interface Quality
Michael Tanksalvala, Henry C. Kapteyn, Margaret M. Murnane, et al.
University of Colorado, Northwestern University, Imec, University of California, KMLabs Inc.
Science Advances

Probing warm dense matter using femtosecond X-ray absorption spectroscopy with a laser-produced betatron source

X-ray Absorption Spectroscopy, XAS, Femtosecond, Pulsed Laser
B. Mahieu et al.
 Université Paris-Saclay, Université de Bordeaux, 
Nature Communications

Sub-picosecond charge-transfer at near-zero driving force in polymer:non-fullerene acceptor blends and bilayers

Organic Photovoltaics, Non-Fullerene Acceptors, NFA, Charge-Transfer Rates, Morphology-Dependent Exciton Diffusion
Yufei Zhong et al.
University of Bern, National Center for Nanoscience and Technology, Universidade de São Paulo (USP), Technische Universität Dresden, University of Potsdam, National Institute of Standards and Technology (NIST), Hasselt University
Nature Communications

In situ single-shot diffractive fluence mapping for X-ray free-electron laser pulses

Free-Electron Lasers, FELs, Extreme Ultraviolet, XUV, XUV Diffraction
Michael Schneider et al.
Max-Born-Institut Berlin, Elettra Sincrotrone Trieste S.C.p.A., Istituto Officina dei Materiali, Technische Universität Berlin
Nature Communications

All Publications

Orientational Ordering within Semiconducting Polymer Fibrils

Crystal-Amorphous Interphase, Fibrils, Orientational Ordering, Polarized Resonant Soft X-Ray Scattering, Scattering Anisotropy
Subhrangsu Mukherjee, Harald Ade, et al.
North Carolina State University, National Institute of Standards and Technology
Advanced Functional Materials

A highly efficient nanofocusing system for soft x rays

Optical Aberrations, Optical Elements, X-Rays, Ptychography
Yoko Takeo, Hidekazu Mimura et al.
The University of Tokyo, Japan Synchrotron Radiation Research Institute, Japan Science and Technology Agency, Natsume Optical Corporation
Applied Physics Letters

Experimental and theoretical evidence for hydrogen doping in polymer solution-processed indium gallium oxide

IGO:PVA Film, Extended X-RAy Absorption Fine Structure (EXAFS), Resonant Soft X-Ray Scattering (R-SoXS), Ultraviolet Photoelectron Spectrosocpy (UPS), Fourier Transform-Infrared (FT-IR) Spectroscopy, Time-Of-Flight Secondary-Ion Mass Spectrometry (ToF-SIMS)
Wei Huang et al.
Northwestern University, Florida State University, Missouri University of Science and Technology, The State University of New Jersey, National Institute of Standards and Technology

Ultrafast Time-Evolution of Magnetic Chirality Probed by Circular Dichroism in X-Ray Resonant Magnetic Scattering in Homochiral Skyrmionic Systems

Noncollinear Spin Textures, Ferromagnetic Ultrathin Films, Interfacial Dzyaloshinskii-Moriya (DM) Interaction, Optical Pump Probe, Time-Resolved X-Ray Resonant Magnetic Scattering, XRMS
Cyril Leveillé et al.
Synchrotron SOLEIL, Univ. Paris-Saclay, Sorbonne Université, Elettra-Sincrotrone Trieste, University of Nova Gorica, Diamond Light Source, University of Exeter

Influence of Polymer Aggregation and Liquid Immiscibility on Morphology Tuning by Varying Composition in PffBT4T‐2DT/Nonfullerene Organic Solar Cells

Calorimetry, Morphology, Nonfullerene, Organic Photovoltaics, Phase Behavior
Zeinab Hamid et al.
Imperial College London, King Abdullah University of Science and Technology (KAUST)
Advanced Energy Materials

Optimized manufacturing of thermoplastic biocomposites by fast induction-heated compression moulding: influence of processing parameters on microstructure development and mechanical behaviour

Biocomposite, Mechanical Properties, Microstructural Analysis, Compression Moulding
K.R. Ramakrishnan et al.
Université Montpellier, Université de Toulouse
Composites Part A; Applied Science and Manufacturing

Characterization of a back-illuminated CMOS camera for soft x-ray coherent scattering

Synchrotron, Soft X-Ray Coherent Scattering, sCMOS, Beamline
Kewin Desjardins et al.
Synchrotron SOLEIL, Lund University
AIP Conference Proceedings

Rapid sample delivery for megahertz serial crystallography at X-ray FELs

X-Ray Free-Electron Lasers, FELs, X-ray FEL Pulse Trains, Megahertz Repetition Rates
Max O Wiedorn et al.
Center for Free-Electron Laser Science, Universität Hamburg, Hamburg University of Technology, European XFEL GmbH, Arizona State University, Universidad de Sevilla

Self-channelled high harmonic generation of water window soft X-rays

High Harmonic Generation, HHG, Coherent X-ray Source, Infrared Lasers, Soft X-Ray
V. Cardin et al.
Institut national de la Recherche Scientifique, Few-cycle Inc., Université de Bordeaux, Institute for Photonics and Nanotechnologies CNR-IFN, National Institute for R&D Isotopic and Molecular Technologies
Journal of Physics B

Beam drift and partial probe coherence effects in EUV reflective-mode coherent diffractive imaging

Extreme Ultraviolent Lithography, EUV, Reflective-Mode Lensless Imaging, Multi-Layer Mask
Patrick Helfenstein et al.
Paul Scherrer Institut
Optics Express